--- title: "Current-Voltage(I-V) Features of Photovoltaic Modules" author: "Jiqi Liu, Alan Curran, Justin S. Fada, Xuan Ma, Wei-Heng Huang, Jennifer L. Braid, Roger H. French" date: "`r Sys.Date()`" output: rmarkdown::html_vignette vignette: > %\VignetteIndexEntry{IV features} %\VignetteEngine{knitr::rmarkdown} %\VignetteEncoding{UTF-8} --- Data Description ----------------------------------- The dataset consists of current-voltage($I-V$) features obtained by $I-V$ feature extraction from $I-V$ curves of photovoltaic (PV) modules. The features have been extracted using the ddiv package algorithm for brand A PV modules under damp heat indoor accelerated exposures for up to 3000 hours. The I-V curves were measured in a step-wise manner after every 500h of exposure time, and provided by the SunEdison company. The I-V features include max power ($P_{mp}$), short circuit current ($I_{sc}$), current at max power ($I_{mp}$), fill factor ($FF$), series resistance ($R_s$), shunt resistance ($R_{sh}$), open circuit voltage($V_{oc}$), voltage at max power ($V_{mp}$). $R_{sh}$ is too noisy to contain for modeling. After checking the correlation between $I_{sc}$, $I_{mp}$, $V_{oc}$, $V_{mp}$, $FF$, $R_s$, we find that $FF$, $R_s$, $V_{mp}$ are highly correlated, and therefore only choose one of these three variables to be included in the model. Here we choose $I_{sc}$, $I_{mp}$, $R_s$ and $V_{oc}$ to be contained in the model and these four I-V features show no indication of high correlation. The trend of the I-V features are related with the mechanisms of PV degradation. The variable '$dy$' is time that has been converted into decimal years so that $dy$=1 corresponds to 1 year of exposure time. We use this dataset to build an network model with time ($dy$) as the exogenous stressor variable, four I-V features ($I_{sc}$, $I_{mp}$, $R_s$ and $V_{oc}$) as mechanistic endogenous variables and maximum power ($P_{mp}$) as the endogenous response variable. Load data and run code to build netSEM ------------------------------------------ ```{r, message=FALSE, eval=FALSE} ## Load the acrylic data set data("IVfeature") ## Run netSEMp1 model ans1 <- netSEMp1(IVfeature) ## Plot the network model for principle 1 plot(ans1, cutoff = c(0.25, 0.5, 0.8)) ## Run netSEMp2 model ans2 <- netSEMp2(IVfeature) ## Plot the network model for principle 2 plot(ans2, cutoff = c(0.25, 0.5, 0.8)) ``` Network diagram for data -------------------------- The direct path from dy to $P_{mp}$ has an $adj. R^2$ of 0.757. Considering the path with one mechanism, the paths contain $I_{mp}$ or $R_s$ are likely to be as good as the direct path. The path from $dy$ to $R_s$ has an $adj. R^2$ of 0.761 and the path from $R_s$ to $P_{mp}$ has an $adj. R^2$of 0.912. The path from dy to $I_{mp}$ has an $adj. R^2$ of 0.683 and the path from $I_{mp}$ to $P_{mp}$ has an $adj. R^2$ of 0.829. And we further use the pathwayRMSE function to calculate the root mean squared error(RMSE) of the direct path and the two paths with $I_{mp}$ or $R_s$. The RMSE for the direct path is 2.8998, for the path contain $I_{mp}$ is 3.3007, for the path contain $R_s$ is 2.9053. So overall, the predicted accuracy of the direct path and the path contain $R_s$ are very similar and the latter one with $R_s$ informs us about the active the degradation mechanism. ```{r, out.width="675px", echo=FALSE, fig.cap="IVfeature netSEMp1 model"} knitr::include_graphics("IVfeature1.png") ``` ```{r, out.width="800px", echo=FALSE, fig.cap="IVfeature netSEMp2 model"} knitr::include_graphics("IVfeature2.png") ``` Reference -------------------------- 1. ddiv: Data Driven I-v Feature Extraction, R package, https://CRAN.R-project.org/package=ddiv. 2. J. Liu, Alan Curren, Justin S. Fada, Xuan Ma, Wei-Heng Huang, C.Birk Jones, E. Schnabel, M. Kohl, Jennifer L. Braid, and Roger H.French, “Cross-correlation Analysis of the Indoor Accelerated and Real World Exposed Photovoltaic Systems Across Multiple Climate Zones,” in IEEE WCPEC-7 Conference, HI, 2018. DOI: https://doi.org/10.1109/PVSC.2018.8547840 Acknowledgment -------------------------- This material is based upon work supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number DE-EE0007140.